Probe Card Type

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Cantilever

Features : Short manufacturing time, easy for assembly and maintainance.

Limitations : Only for peripheral arrangement

Applications : Logic IC, DDI

Vertical

Features : Area array arrangement, capable of multi-DUT testing versus cantilever-type

Limitations : High initial cost, long lead time to produce

Applications : DRAM, flash memory, logic IC

Membrane

Features : High-frequency property (up to 10GHz), high design flexbility

Limitations : Extra pressure needed, weak dimensional stability

Applications : RF IC

MEMS

Features : Fine needle pitch, high pin count, low probe force

Limitations : High replacement cost

Applications : DRAM, flash memory, logic IC, SoC